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Standards Development
| Reference | Standards description | Committee | Status |
|---|---|---|---|
| BS EN IEC 63551-1 ED1 |
BS EN 63551-1 ED1 Semiconductor devices - Detection modules of autonomous land vehicle. Part 1:Testing methods of detection performance for LiDAR Categories: Semiconductor devices. General | Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN IEC 62047-58 |
BS EN 62047-58 Ed.1.0 Micro-electromechanical systems. Part 58: Test methods for performances of MEMS thermopile devices Categories: Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN IEC 62047-57 |
BS EN 62047-57 Ed.1.0 Micro-electromechanical systems. Part 57: RF MEMS directional coupler Categories: Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN 63567-4 Ed.1.0 |
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment. Part 4: Evaluation methods for dimensional accuracy of laser dicing process Categories: Semiconductor devices. General | Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN 63608-1 |
Semiconductor devices - Reliability evaluation methods for vibration energy harvesters. Part 1: Mechanical reliability under shock Categories: Semiconductor devices. General | Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN IEC 63567-1 ED.1 |
BS EN 63567-1 ED.1 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment. Part 1: Transmittance evaluation method of EUV pellicle Categories: Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN IEC 62047-51 ED1 |
BS EN 62047-51 ED1 Semiconductor Devices - Micro-electromechanical Devices. micro-electromechanical devices Categories: Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS IEC 63581-1 ED1 |
Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers. Part 1: Classification of defects Categories: Semiconductor devices. General | Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN IEC 63550-4 ED1 |
BS EN 63550-4 ED1 Semiconductor devices - Neuromorphic devices. Part 4: Evaluation method of asymmetry in neuromorphic memristor devices Categories: Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |
| BS EN IEC 63550-3 ED1 |
BS EN 63550-3 ED1 Semiconductor devices - Neuromorphic devices. Part 3: Evaluation method of spike dependent plasticity in memristor devices Categories: Semiconductor devices. Other |
EPL/47 Semiconductors | Public comment |