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BS EN IEC 62047-58 BS EN 62047-58 Ed.1.0 Micro-electromechanical systems. Part 58: Test methods for performances of MEMS thermopile devices

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Semiconductor devices. Other
Comment period start date:
Comment period end date:
Number of comments:
0

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Scope

This part of IEC 62047 defines the test methods for the performances of MEMS thermopile devices.

The standard applies to the thermopile devices manufactured using MEMS technology that are designed to convert thermal energy (typically in the form of infrared radiation) into electrical signals. These devices are mainly used in applications including, but not limited to, non-contact temperature measurement, thermal imaging, and gas sensing.

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