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BS EN IEC 63550-3 ED1 BS EN 63550-3 ED1 Semiconductor devices - Neuromorphic devices. Part 3: Evaluation method of spike dependent plasticity in memristor devices

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Semiconductor devices. Other
Number of comments:
0

Scope

This part of IEC 62951 specifies the test methods for evaluating the spike dependent plasticity of neuromorphic memristor devices. The test methods in this international standard include spike time dependent plasticity (STDP), indirect STDP, spike rate dependent plasticity (SRDP), and their retention properties. This document shall be applicable to neuromorphic memristor devices without any limitations prone to device technology and size.

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