British Standards Institution

Source:: IEC
Committee:: EPL/47 - Semiconductors
Categories:: Semiconductor devices. General
Comment period start date:: 10/02/2025
Comment period end date:: 26/02/2025
Number of comments:: 0

Comment by:

26th Feb

Scope

This document specifies evaluation methods for the mechanical reliability of vibration energy harvesting devices. This standard applies to all vibration energy harvesting devices, regardless of size and power generation principle. The method includes shock, vibration, frequency sweep, and drop tests. Shock vibration covers a wide range of definitions, including its peak acceleration, duration/frequency, and the shape of the shock pulse (e.g., half-sine, square, sawtooth, etc.). According to typical usage conditions, the change in power is measured before and after the tests under conditions that include actual power management circuits or load resistances.

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Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

02/05/2025

3. Public Comments

Public Comments start date:

10/02/2025

Public Comments end date:

26/02/2025

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Standards Development

BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters. Part 1: Mechanical reliability under shock

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