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Standards Development
This international standard specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure a resistance uniformity of large area printed film. This method cannot measure sheet resistance. This standard can be performed either with an apparent electrical resistance measurement method or with a potential tomography method.
For fabrication of large area printed electronics, a conductive layer should be printed uniformly in the whole area. The most common method to measure electrical resistivity of printed conductive layer is a 4-point probe method which is very useful for obtaining sheet resistance of a conductive film. However, the measurement area of the 4 -point probe method is relatively small compared to the whole area of large area devices. Therefore, a measurement method that can be adopted to measure electrical resistance uniformity for large area device is needed.
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