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PNW 47-2973 ED1: Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Information management | Standardization. General rules
Comment period start date:
Comment period end date:

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Scope

This part of IEC 63551 specifies the testing conditions and testing procedures that can be used to evaluate and determine the optical performance of semiconductor devices used in LiDAR systems, focusing on packaged LD-PD performance at chip-scale.

Purpose

With the rapid development of autonomous driving and smart mobility technologies, the demand for LiDAR systems, one of the core sensing devices in these fields, has grown significantly. It is projected that by 2026, the global market for LiDAR systems appl ied in autonomous vehicles and intelligent transportation will reach several billion dollars. LiDAR, with their unique advantages in high-precision distance measurement and complex environment recognition, are considered a key component for the future of autonomous driving.

The overall functionality of autonomous driving systems is closely related to the accuracy and stability of the optical performance of devices within LiDAR systems. Therefore, establishing an international standard to regulate the testing methods and quali ty control of these devices is essential. This proposal aims to provide a unified reference standard for the optical performance of devices in LiDAR, thereby promoting industry standardization and technological innovation. Moreover, the proposed standard will help stimulate the development of next-generation LiDAR technologies, laying the foundation for more advanced autonomous driving and intelligent systems.

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