British Standards Institution

Source:: IEC
Committee:: EPL/47 - Semiconductors
Categories:: Information management | Standardization. General rules
Comment period start date:: 12/06/2025
Comment period end date:: 29/07/2025

Comment by:

29th Jul

Scope

This part of IEC 62047 defines the test methods for the performance of MEMS thermopile devices.

The standard applies to the MEMS thermopile devices used in temperature measurement or imaging.

Purpose

MEMS thermopile devices convert thermal energy into electrical signals, featuring high integration and low power consumption. Widely used in temperature measurement, imaging, healthcare, and industrial automation, standardized testing methods are crucial for quality improvement and innovation promotion.

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Discard

Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal

Proposal start date:

12/06/2025

Proposal end date:

29/07/2025

2. Draft

3. Public Comments

4. Comment Resolution

5. Approval

6. Publication

Learn more about the standards development process

Standards Development

PNW 47F-513 ED1: Micro-electromechanical systems-Part 58: Test methods for performances of MEMS thermopile devices

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