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PNW 47E-859 ED1: Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Information management | Standardization. General rules
Comment period start date:
Comment period end date:

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Scope

This part of IEC 60747-14-X specifies the terms, definitions, configurations and test methods that can be used to evaluate and determine the performance characteristics of spectral sensors.

Purpose

With the increasing adoption of spectral sensing technology across industries such as agriculture, healthcare, and environmental monitoring, the demand for spectral sensors is rapidly growing. By 2025, the global market for spectral sensors in various appl ications, including precision agriculture and medical diagnostics, is expected to reach billions of pounds. Spectral sensors, known for their ability to capture and analyse specific wavelengths of light, offer unique advantages in identifying material properties and detecting subtle changes in environmental conditions, making them one of the most promising sensing technologies.

The performance of systems relying on spectral sensors is highly dependent on the accuracy and reliability of these sensors. Therefore, it is crucial to develop an international standard that defines testing methods and quality control processes for spectr al sensors. This proposal aims to establish a unified standard that will guide the manufacturing of spectral sensors, fostering industry standardization and encouraging the development of new technologies in the field. Additionally, this standard will support the innovation of next-generation spectral sensing applications, driving advancements in areas like smart farming, personalized healthcare, and environmental protection.

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Please email further comments to: debbie.stead@bsigroup.com

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