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BS EN IEC 63550-5 BS EN 63550-5 ED1 Semiconductor devices - Neuromorphic devices. Part 5: Evaluation method of endurance and retention in memristor devices

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Semiconductor devices
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Comment period end date:
Number of comments:
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Scope

This part of IEC 63550-5 specifies the test methods for evaluating the endurance and retention of neuromorphic memristor devices. This document is applicable to neuromorphic two-terminal memristor devices, including both binary and multi-level memristor devices, without any limitations of device technology and size.

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