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BS EN 60747-14-13 ED1 Semiconductor devices. Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Unclassified documents
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Number of comments:
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Scope

This part of IEC 60747-14 specifies the terms, definitions, configurations and test methods that can be used to evaluate and determine the performance characteristics of spectral sensors. This document applies to the performance testing for spectral sensors. This document exclude MEMS spectral sensors.

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