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BS EN IEC 63551-2 ED1 BS EN 63551-2 ED1 Semiconductor devices - Chip-scale testing for autonomous vehicles. Part 2: Optical performance of LiDAR

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Semiconductor devices. General | Semiconductor devices. Other
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Comment period end date:
Number of comments:
0

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Scope

This part of IEC 63551 specifies the testing conditions and testing procedures that can be used to evaluate and determine the optical performance of semiconductor devices used in LiDAR systems, focusing on packaged LD-PD performance at chip-scale.

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