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Standards Development
This part of IEC 62433 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called integrated circuit immunity model - conducted immunity, ICIM-CI. It is intended to be used for predicting the levels of immunity to conducted radio frequency (RF) disturbances applied on IC pins.
In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool.
This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC.
The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations.
This part of IEC 62433 has two main parts:
– the electrical description of ICIM-CI macro-model elements;
– the representation of ICIM-CI macro-model elements in XML-based CIML (3.1.7) schema, according to encoding scheme defined in IEC 62433-1, to enable a more generic, interoperable and simulation-orientated format for immunity analysis.
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