If you have difficulty in submitting comments on draft standards you can use a commenting template and email it to admin.start@bsigroup.com. The commenting template can be found here.

We use cookies to give you the best experience and to help improve our website

Find out what cookies we use and how to disable them

BS EN 60747-5-17 Ed.1.0 Semiconductor devices. Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Unclassified documents
Comment period start date:
Comment period end date:
Number of comments:
0

Comment by:

Scope

This part of IEC 60747 specifies the standard measurement conditions and measuring methods for determining optoelectronic characteristic of micro scale light emitting diode (micro-LED) arrays.

This document applies to 2-dimensional single-colour micro-LED arrays with both length and width of micro-LED are less than 120 µm.

Display systems and lighting are out of scope of this part of IEC 60747.

Read draft and comment

Comment on proposal

Required form fields are indicated by an asterisk (*) character.

Discard

Please email further comments to: debbie.stead@bsigroup.com

Follow standard

You are now following this standard. Weekly digest emails will be sent to update you on the following activities:

You can manage your follow preferences from your Account. Please check your mailbox junk folder if you don't receive the weekly email.

Unfollow standard

You have successfully unsubscribed from weekly updates for this standard.

Error