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This part of IEC 62132 provides general information and definitions on the measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports applicable to all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).
The purpose of this document is to outline the general conditions necessary for establishing a consistent testing environment and for obtaining a quantitative assessment of RF immunity of integrated circuits (ICs). It describes the key parameters likely to affect test results. Any deviations from these guidelines are clearly stated in the individual test report. The measurement results may be used for comparison or other relevant purposes.
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