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BS EN 61967-1 Ed.3.0 Integrated circuits - Measurement of electromagnetic emissions. Part 1: General conditions and definitions

Source:
IEC
Committee:
EPL/47 - Semiconductors
Categories:
Unclassified documents
Comment period start date:
Comment period end date:
Number of comments:
0

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Scope

This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic emissions from integrated circuits(ICs). It also definesf general measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports applicable to all parts of the IEC 61967 series. Test method comparison tables are included in Annex A to assist users in selecting the appropriate measurement method(s).

The purpose of this document is to outline the general conditions necessary for establishing a consistent testing environment and for obtaining a quantitative assessment of RF emissions from ICs. It describes the key parameters likely to affect test results. Any deviations from these guidelines are clearly documented in the test report.

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