British Standards Institution

Source:: IEC
Committee:: EPL/47 - Semiconductors
Categories:: Semiconductor devices. General
Comment period start date:: 22/07/2025
Comment period end date:: 13/08/2025
Number of comments:: 0

Comment by:

13th Aug

Scope

This part of IEC 62047-56 specifies the requirements and test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor.

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Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

17/10/2025

3. Public Comments

Public Comments start date:

22/07/2025

Public Comments end date:

13/08/2025

Learn more about the standards development process

Standards Development

BS EN 62047-56 Ed.1.0 Micro-electromechanical devices. Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

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