British Standards Institution

Source:: IEC
Committee:: EPL/47 - Semiconductors
Categories:: Semiconductor devices. General
Comment period start date:: 10/02/2025
Comment period end date:: 26/03/2025
Number of comments:: 0

Comment by:

26th Mar

Scope

This international standard establishes the basis for evaluating the reliability of solid insulation within a device containing one or more semiconductor components. It shall not be used as stand-alone standard for component certifications, but as reference point for component standards. For device certifications their specific standards shall be used.

It describes the key breakdown mechanisms, ageing behaviour and subsequent failure mechanisms of the isolating semiconductor devices. Further it proposes the measurement methods to address these failure mechanisms of the isolation during development, qualification and production.

Essential insulation material characteristics

• safety tests

• terminology

This international standard specifies the failure mechanisms and measurement methods, essential insulation material characteristics, safety test and terminology for the evaluation of the reliability of solid insulation for semiconductor devices.

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Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

02/05/2025

3. Public Comments

Public Comments start date:

10/02/2025

Public Comments end date:

26/03/2025

Learn more about the standards development process

Standards Development

BS EN 63492-1 Semiconductor devices - Isolation for semiconductor devices. Part 1: Failure mechanisms and measurement methods to evaluate solid insulation for semiconductor devices

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