British Standards Institution

Source:: ISO
Committee:: CII/60 - Surface chemical analysis
Categories:: Chemical analysis
Comment period start date:: 17/03/2025
Comment period end date:: 10/05/2025
Number of comments:: 0

Comment by:

10th May

Scope

This document specifies a method to optimize the mass calibration accuracy in time-of-flight secondary ion mass spectrometry (SIMS) instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.

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Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

16/09/2024

3. Public Comments

Public Comments start date:

17/03/2025

Public Comments end date:

10/05/2025

Learn more about the standards development process

Standards Development

BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

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