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CII/60 - Surface chemical analysis

Sector: Manufacturing

Categories: Chemical technology | Surfaces. Properties | IT applications. Science | Physicochemical analysis | Chemical analysis | Chemical industry. Production | Chemical reagents | | Measuring instruments. Optical

Overview: Under the direction of the Standards Policy and Strategy Committee, is responsible for the input to ISO/TC 201 and its working groups for standards relating to Surface chemical analysis

Committee standards activity

In Progress (24)
Reference Standards description
Status ?

The standards development process is divided into chronological stages: Proposal; Drafting; Public comment; Comment resolution; Approval; Published standard.

PD ISO/TS 25138 Surface chemical analysis — Analysis of metal oxide films by glow-discharge optical-emission spectrometry

Categories: Chemical analysis

Comment resolution begins : 2024-09-17
Comment resolution
PD ISO/TS 15338 Surface chemical analysis — Glow discharge mass spectrometry — Operating procedures

Categories: Unclassified documents

Comment resolution begins : 2024-09-16
Comment resolution
PD ISO/TR/TR 13096 Surface chemical analysis -- Scanning-probe microscopy -- Guidelines for the description of AFM probe properties

Categories: Chemical analysis

Drafting begins : 2017-11-21
Drafting
PD ISO/TR 18392 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds

Categories: Chemical analysis

Drafting begins : 2022-09-05
Drafting
PD ISO/TR 13096 Guideline to describe AFM probe properties

Categories: Unclassified documents

Proposal begins :
Proposal
ISO/TC201 N649 & N650 - ISO/NP 24465 Protocol for data acquisition and determination of the minimum detectability of Surface Plasmon Resonance device

Categories: Information management | Standardization. General rules | Manufacturing | Chemical technology | Chemical reagents | Chemical analysis | Chemical industry products. Other | Chemical industry equipment. General | Chemical industry equipment. Other

Proposal begins : 2019-06-24
Proposal
ISO/NP TS 21947 Machine Learning Application to Surface Analysis Data. Part I: Mass Spectrum and Imaging

Categories: Information management | Standardization. General rules

Proposal begins : 2024-04-18
Proposal
BS ISO 4508 Surface chemical analysis--Scanning probe microscopy--Guidelines for the method and procedure for determining the effect of temperature on AFM nano-scale dimension measurements

Categories: Unclassified documents

Drafting begins : 2024-11-12
Drafting
BS ISO 4245 Diagnostic method whether a binary organic mixture can be quantitated by the relative sensitivity factor methods for SIMS

Categories: Unclassified documents

Proposal begins :
Proposal
BS ISO 24689 Surface chemical analysis — Rule sets for automatic retrieval of information from the X-Ray photoelectron spectroscopy survey spectrum — Identification and use of significant minor features in the XPS survey spectrum.

Categories: Unclassified documents

Proposal begins :
Proposal
Published (77)
Reference Standards description
Status ?

The standards development process is divided into chronological stages: Proposal; Drafting; Public comment; Comment resolution; Approval; Published standard.

PD ISO/TS 25138:2019 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry

Categories: Chemical analysis

Published standard begins : 2019-08-16
Published standard
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis

Categories: Chemical analysis

Published standard begins : 2015-07-31
Published standard
PD ISO/TS 15338:2020 Surface chemical analysis. Glow discharge mass spectrometry. Operating procedures

Categories: Chemical analysis

Published standard begins : 2020-03-11
Published standard
PD ISO/TR 23173:2021 Surface chemical analysis. Electron spectroscopies. Measurement of the thickness and composition of nanoparticle coatings

Categories:

Published standard begins : 2021-07-08
Published standard
PD ISO/TR 22335:2007 Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer

Categories: Chemical analysis

Published standard begins : 2007-08-02
Published standard
PD ISO/TR 19693:2018 Surface chemical analysis. Characterization of functional glass substrates for biosensing applications

Categories: Chemical analysis

Published standard begins : 2018-02-19
Published standard
PD ISO/TR 19319:2013 Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods

Categories: Chemical analysis

Published standard begins : 2013-03-15
Published standard
PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information

Categories: Chemical analysis

Published standard begins : 2016-05-13
Published standard
PD ISO/TR 16268:2009 Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation

Categories: Chemical reagents | Chemical analysis

Published standard begins : 2009-11-24
Published standard
PD ISO/TR 15969:2021 Surface chemical analysis. Depth profiling. Measurement of sputtered depth

Categories: Chemical analysis

Published standard begins : 2021-03-26
Published standard
Withdrawn (41)
Reference Standards description
Status ?

The standards development process is divided into chronological stages: Proposal; Drafting; Public comment; Comment resolution; Approval; Published standard.

PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information

Categories: Chemical analysis

Withdrawn begins : 2011-03-16
Withdrawn
PD ISO/TR 14187:2011 Surface chemical analysis. Characterization of nanostructured materials

Categories: Chemical analysis

Withdrawn begins : 2020-07-03
Withdrawn
ISO/TR 19319:2003 ISO/TR19319 : 2003 Surface chemical analysis - Auger electron spectroscopy and X-Ray photoelectron Spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser

Categories: Unclassified documents

Withdrawn begins : 2013-03-11
Withdrawn
DD ISO/TS 25138:2010 Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry

Categories: Chemical analysis

Withdrawn begins : 2019-08-16
Withdrawn
DD ISO/TS 15338:2009 Surface chemical analysis. Glow discharge Mass spectrometry (GD-MS). Introduction to use

Categories: Chemical analysis

Withdrawn begins : 2020-03-11
Withdrawn
DD ISO/TR 15969:2001 Surface chemical analysis. Depth profiling. Measurement of sputtered depth

Categories: Surfaces. Properties | Chemical analysis

Withdrawn begins : 2021-03-26
Withdrawn
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

Categories: Chemical analysis

Withdrawn begins : 2019-02-15
Withdrawn
BS ISO 20903:2006 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

Categories: Chemical analysis

Withdrawn begins : 2011-11-03
Withdrawn
BS ISO 19318:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

Categories: Chemical analysis

Withdrawn begins : 2021-06-16
Withdrawn
BS ISO 18118:2015 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Categories: Chemical analysis

Withdrawn begins : 2024-03-04
Withdrawn