British Standards Institution

Source:: ISO
Committee:: STI/33 - Electrodeposited and related coatings
Categories:: Metrology and measurement. General
Comment period start date:: 07/01/2025
Comment period end date:: 02/03/2025
Number of comments:: 0

Comment by:

2nd Mar

Scope

This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness d of a transparent layer and the optical (refractive index n) or dielectric (real part ε1) constants/functions based on the transparent single layer model within a spectral region, for which k = 0 applies.

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Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

01/11/2024

3. Public Comments

Public Comments start date:

07/01/2025

Public Comments end date:

02/03/2025

Learn more about the standards development process

Standards Development

BS ISO 23131-3 ISO 23131-3 Ellipsometry. Part 3: Transparent single layer model

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