British Standards Institution

Source:: ISO
Committee:: CII/60 - Surface chemical analysis
Categories:: Chemical analysis
Comment period start date:: 14/11/2024
Comment period end date:: 07/01/2025
Number of comments:: 0

Comment by:

7th Jan

Scope

This document describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.

It is limited to a description of general procedures of quantification of chemical composition and thickness in GD-OES compositional depth profiling and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements and include results of interlaboratory tests for validation of the methods.

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Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

09/09/2024

3. Public Comments

Public Comments start date:

14/11/2024

Public Comments end date:

07/01/2025

Learn more about the standards development process

Standards Development

BS ISO 11505 ISO 11505 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

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