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Standards Development is a service provided by BSI Group
Semiconductor devices. Micro-electromechanical devices. Environmental test methods of MEMS piezoelectric thin films for sensor application
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Generic specification
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality. Guidelines for the use
Piezoelectric sensors. Generic specifications
Measurement of quartz crystal unit parameters. Measurement of drive level dependence (DLD)
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric, dielectric and electrostatic oscillators
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections. Ceramic enclosures
Piezoelectric sensors. Physical sensors