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Standards Development is a service provided by BSI Group
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Fast BTI test for MOSFET
Semiconductor devices. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for stretchability, flexibility, and stability of flexible resistive memory
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability
Printed electronics. Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
Semiconductor devices. Discrete devices. Field-effect transistors
Standards Development