Standards Development

Scope

This part of IEC TS 62607 establishes a standardized method to determine the key control characteristic

- spectral radiance

for quantum dot based light-emitting diodes (QLEDs) by 

- microscopic imaging method.

The spectral radiance is obtained by measuring the emission spectrum of QLED devices with a spectrometer integrated into a microscopic imaging system. From the measured spectral radiance, the following parameters can be derived: peak wavelength, full width at half maximum (FWHM), luminance, chromaticity coordinates, and luminance uniformity. 

Purpose

With the rapid development of display technology and the upgrading of smart terminal consumption, the demand for QLED (Quantum Dot Light-Emitting Diode) products, one of the core representatives of next-generation display technologies, has grown significantly. It is projected that by 2026, the global QLED market will reach approximately 82.61 billion yuan (RMB) and is expected to grow to about 429.15 billion yuan by 2033, with a compound annual growth rate (CAGR) of 26.54%. QLED, with its unique advantages in wide color gamut, high brightness and stable color performance, is considered a key component driving the upgrade of display scenarios covering high -end TVs and smartphone.

The market acceptance and industrialization progress of QLED products are closely linked to Key Control Characteristics such as spectral radiance. Therefore, formulating and implementing a clear international standard to regulate the technical details of Q LED spectral radiance measurement via microscopic imaging (including equipment requirements, environmental conditions, data calculation methods, etc.) is crucial for ensuring the stability of optical performance within QLED's Key Control Characteristics. This proposal aims to provide a unified reference standard for QLED spectral radiance measurement through microscopic imaging, thereby promoting industry standardization and technological innovation.