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Standards Development
This document specifies requirements for quantitative analysis of rare earth minerals’ elemental composition by electron probe microanalyzer, including the equipment and materials, specimen preparation, reference materials, analytical procedures (including qualitative analysis, selection of analytical conditions, peak overlap correction, etc.), processing of results and test report. This document is applicable for electron probe quantitative analysis of rare earth minerals stabilized under electron beam bombardment. This document is applicable for quantitative analysis with an electron probe, as well as for quantitative analysis with a scanning electron microscope equipped with a wavelength dispersive spectrometer (WDS).
The rare earth elements are critically important in high technology. The accurate quantitative analysis of elemental composition in rare earth minerals (REMs) is of great significance to the study of deposit genesis, prospecting and mineral exploitation and utilization. Electron probe microanalysis (EPMA) is an important method for the elemental composition analysis of REMs, however, the quantitative analysis of REMs is a difficult point in EPMA, the main reasons are: (a) There are many characteristic X-ray lines excited by a single rare earth element, and the distribution among the lines is dense; (b) Rare earth elements often exist in the same mineral because of their similar atomic structure and crystal chemical properties; (c) The phenomenon of overlapping interference between multiple lines of rare earth elements is very serious. Therefore, in order to better guide the electron probe laboratory to carry out quantitative analysis of REMs and obtain accurate and reliable analysis results, it is necessary to develop a standard method for quantitative analysis of REMs by EPMA. (Please use this field or attach an annex)
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