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New Work Item Proposal 113-999 ED1: Nanomanufacturing – Key control characteristics - Part 11-6: Electromagnetic compatibility – Permittivity of carbon nanotube film: waveguide method

Source:
IEC
Committee:
NTI/1 - Nanotechnologies
Categories:
Information management | Standardization. General rules
Comment period start date:
Comment period end date:

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Scope

This part of IEC 62607 establishes a method to determine the key control characteristics

• permittivity for

carbon nanotube films by 

• waveguide method

Since a carbon nanotube is typically provided as a dispersion or dry powder and cannot be measured directly, this document specifies specimen preparation procedures to ensure accurate and repeatable measurements and provides guidelines to minimize and evaluate measurement errors.

Purpose

This International Standard establishes a standardized method for determining the permittivity of carbon nanotube (CNT) films using the waveguide. It provides requirements and procedures to ensure accurate, repeatable and traceable measurements of the real and imaginary components of relative permittivity for CNT film specimens.

The document addresses specimen preparation, specifying substrate selection, coating and drying procedures, and dispersion/viscosity control to produce planar film specimens with uniform thickness, adequate rigidity, and minimal contamination. Because CNTs are commonly supplied as powders or dispersions, this document establishes procedures for preparing CNT films suitable for waveguide measurements.

The measurement system comprises a two-port vector network analyzer (VNA) and frequency -band specific rectangular waveguide fixtures. Requirements for waveguide dimensions, waveguide -to-coaxial adapters, calibration kits (for example TRL or OSLT), and hand ling of cables and connectors are included to minimize systematic errors. Calibration, verification with well-characterized reference specimens, and conditions for calibration renewal are specified.

An inverse algorithm based on an equivalent-circuit representation of the test fixture is provided for calculating complex permittivity from measured S-parameters, together with the required phase-correction procedures. The document also includes guidance on measurement uncertainty mitigation, verification measurements, and procedural controls to ensure that permittivity values reported in accordance with this International Standard are reliable and reproducible

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