British Standards Institution

Source:: ISO
Committee:: CII/9 - Microbeam analysis
Categories:: Information management | Standardization. General rules
Comment period start date:: 06/08/2025
Comment period end date:: 28/09/2025

Comment by:

28th Sep

Scope

This document specifies a platform-independent data file format for digital images generated by a scanning electron microscope (SEM) by adapting the TIFF based format.

Purpose

Each SEM manufacturer stores SEM images and related instrument condition information in proprietary formats, creating a barrier to the sharing and archiving of SEM image information. This new work item describes a platform-independent file format, specifying what image information shall be included as tagged data, based on the TIFF 6.0 specification, in each SEM image file.

Comment on proposal

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Discard

Please email further comments to: debbie.stead@bsigroup.com

Standard timeline

1. Proposal

Proposal start date:

06/08/2025

Proposal end date:

28/09/2025

2. Draft

3. Public Comments

4. Comment Resolution

5. Approval

6. Publication

Learn more about the standards development process

Standards Development

ISO/NP 20171 Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electronmicroscopy (TIFF/SEM)

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