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PNW 119-545 ED1: Measurement of the shear contact strength and resistance changes of conductive layer under thermal conditions

Source:
IEC
Committee:
AMT/9 - Printed Electronics
Categories:
Information management | Standardization. General rules
Comment period start date:
Comment period end date:

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Scope

This standard specifies a method to measure shear contact strength as well as changes of the resistance of a conductive layer under thermal conditions in printed electronics.

Purpose

The standard aims to determine the maximum shear strength of a conductive ink layer and its resistance changes under thermal conditions, which are critical for manufacturing printed electronic devices.

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Please email further comments to: debbie.stead@bsigroup.com

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