We use cookies to give you the best experience and to help improve our website

Find out what cookies we use and how to disable them

Adoption of a New Work Item Characterization methods for ion traps used in quantum computing and sensing

Scope

This document specifies the experimental setup, measurement procedure, and analysis of measured data to evaluate the main parameters of interest of ion traps. Furthermore, minimal requirements for the reporting of the experimental setup for the evaluation of main parameters of interest are specified. Therefore, this document is separated into two main sections: i. Trap specifications ii. Measured properties Th e two main sections include several subsections giving detailed description of the tested trap (section i.) e.g ., for fabrication used materials, geometry and the key performance indicators (section ii.) e.g ., heating rate, trap potential. Furthermore, an appendix with a brief description of the principles of the used methods and detailed description of the used setup will be added. The append ix will also include guidance how the measurements can be compared to similar measurements best.

Purpose

Ion traps are an enabling technology for quantum computing and quantum sensing. In recent years, substantial progress has been made towards the commercialization of quantum technologies. This advancement has also affected the market for Io n trap s lead in g to a rapidly evolving market. Suppliers of io n trap modules range from university clean rooms to international semiconductor manufacturers, yielding a wide variety of designs used, materials and processes. With all of these suppliers and most of the end users doing their own characterization of the supplied modules a man I fold of techniques is used. While these techniques and their application may yield accurate results, they are difficult to compare, underscoring the need for standardized characterization methods. Despite decades of academic research that have led to the development of these various characterization techniques, none has been universally adopted as a standard. Even common methods such as heating rate measurements and heat dissipation assessments lack a unified framework, creatin g in consistencies in performance evaluation. To ensure fair comparisons among  different devices and to foster more seamless collaboration with in the industry, there is a need for standardized methods in the testing and characterization of Ion traps.

Comment on proposal

Required form fields are indicated by an asterisk (*) character.


Please email further comments to: debbie.stead@bsigroup.com

Follow standard

You are now following this standard. Weekly digest emails will be sent to update you on the following activities:

You can manage your follow preferences from your Account. Please check your mailbox junk folder if you don't receive the weekly email.

Unfollow standard

You have successfully unsubscribed from weekly updates for this standard.

Error