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Standards Development
This proposed test method is intended to evaluate the ultraviolet light induced power degradation
(UVID) performance of crystalline silicon photovoltaic modules. It focuses on standardizing UV light
sources, test conditions (such as light source intensity and sample/chamber temperature), the
preparation of samples (especially the mini-module samples) and the method to differentiate UVID
from LID/LeTID, etc.
The PV modules under test may be constructed by different combinations of cells and encapsulants.
Cell technologies include, but are not limited to PERC, TOPCon, HJT, etc. Meanwhile, encapsulants
include EVA, POE, EPE, UV-light conversion film and other normal or new-tech encapsulant materials.
The UVID stress test is not designed to test until failure, but to identify UVID risks of modules in a
relatively quick test that simulates the UV exposure equivalent to one to three years of outdoor
conditions.
Research indicated that certain cell technologies, especially for N-type cells, are potentially more
susceptible to UVID due to the deterioration of the surface passivation. A standardized test method
shall be defined to quantify the power degradation of PV modules after UV irradiation.
The UV stability of solar cells embedded in different encapsulation polymers have been extensively
studied. However, It is not easy to accurately measure the UVID of a PV module indoor, and the
measurement results are difficult to quantitatively correlate with the degradation of the PV module
after UV exposure outdoor. The proposed test procedure is intended to accurately determine the UVID
of photovoltaic modules and minimize the effect of other influencing factors.
The existing UV related test methods does not address the spectral mismatch of different UV light
sources with AM1.5 spectrum in the UV range. The varied spectral power distribution of UV light
sources may lead to different test results. The test method in this document will define the light source
spectral requirements in UVID testing to minimize the difference between equipments and labs, and
the gap between indoor and outdoor UV exposure.
Additionally, this document attempts to separate the UVID from typical LID and light and elevated
temperature induced degradation (LETID) by application of certain procedures. To sum up, the
proposed test method is intended to accurately determine the UVID of PV modules, minimizing the
impact of various factors and bridge the gap between indoor and outdoor exposure.
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