Standards Development
This document specifies the main performance parameters and design specifications of the TEM standard grid. This document is mainly applicable to metal grid with diameter of 3.05mm.
1). Grids for use in TEM play a pivotal role in the world of nanoscale imaging and analysis. These grids are tiny, yet they serve as crucial platforms for holding and supporting specimens during examination with TEM. But there is no unified terms defined in this area. 2). The commercial TEM standard grids with the same nominal mesh number, which were provided by different manufactures, might have different actual mesh number, margin width, bridge width, or mesh hole diameter. Inevitably, these commercial TEM standard girds could show different performance. 3). The current commercial TEM standard grids use coordinates with letters or numbers as locations. These locating methods increase processing difficulty and processing cost. They are not conducive to computer recognition and may block the observation of specimens to a certain degree. 4). A new design rule has been developed and standardized to ensure the consistency of actual and nominal parameters for the TEM standard grids. And a new locating method is provided in this standardized design rule to more precisely locate specimens in TEM, thus improving the efficiency of observation. This locating method can be preprogrammed with all the specimen accurate positions in the control system, and thus to achieve automatic operation of the electron microscope. (Please use this field or attach an annex)
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