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ISO/TC 24/SC 4 N 1134, ISO/PWI 23484 Determination of particle concentration by smallangle X-ray scattering (SAXS)

Scope

This standard describes the application of small-angle X-ray scattering for the determination of particle concentration in liquid suspension. Small-angle X-ray scattering (SAXS) is a well-established method to obtain structural information on inhomogeneities in materials at the nanoscale, typically between 1 nm and 100 nm, and is thus perfectly suited for nanoparticulate systems. For sufficiently monodisperse spherical particles, the observed oscillations of the scattered intensity as a function of the momentum transfer, which is directly related to the scattering angle and the wavelength of the incident X-rays, enable the size determination of nanoparticles. In order to determine their concentration in a suspending medium, the differential scattering cross section has to be determined, thus the ratio of the scattered intensity to the incident intensity. Assumptions on the particle shape are required, which can be based on microscopic techniques like electron microscopy. Furthermore, the electron density difference between the particles and the suspending medium needs to be known.

Purpose

The concentration of particles, especially nanoparticles, in a liquid medium directly impacts the ability to assess the scale and reproducibility of the production process, it allows optimisation of efficiency and supports regulatory compliance. This measurement is also useful to monitor and control the intentional or accidental release of engineered nanoparticles into the environment at the production plant, as well as by end-users. Small angle X-ray scattering is regarded as one of the very few techniques that can provide, at least for some classes of materials, traceable results for the particle concentration.

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