If you have difficulty in submitting comments on draft standards you can use a commenting template and email it to admin.start@bsigroup.com. The commenting template can be found here.
Standards Development
This document defines the procedure for determining the point resolution, called Scherzer resolution, of high-resolution transmission electron microscopes (HREM), which have the ability to visualize the sample structure with sub-nanometer fineness. The measurement of real spherical aberration coefficient of the objective lens used is also included in the measurement procedure.
This document does not treat the information limits, lattice resolution, and STEM resolution. In addition, Cs-corrected TEM is not included as the target instrument of this standard.
You are now following this standard. Weekly digest emails will be sent to update you on the following activities:
You can manage your follow preferences from your Account. Please check your mailbox junk folder if you don't receive the weekly email.
You have successfully unsubscribed from weekly updates for this standard.
Comment on proposal
Required form fields are indicated by an asterisk (*) character.