British Standards Institution

Source:: ISO
Committee:: CII/9 - Microbeam analysis
Categories:: Optical equipment
Comment period start date:: 18/07/2025
Comment period end date:: 10/09/2025
Number of comments:: 0

Comment by:

10th Sep

Scope

This document defines the procedure for determining the point resolution, called Scherzer resolution, of high-resolution transmission electron microscopes (HREM), which have the ability to visualize the sample structure with sub-nanometer fineness. The measurement of real spherical aberration coefficient of the objective lens used is also included in the measurement procedure.

This document does not treat the information limits, lattice resolution, and STEM resolution. In addition, Cs-corrected TEM is not included as the target instrument of this standard.

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Standard timeline

1. Proposal (Complete)

Proposal start date:

2. Draft (Complete)

Draft start date:

14/05/2025

3. Public Comments

Public Comments start date:

18/07/2025

Public Comments end date:

10/09/2025

Learn more about the standards development process

Standards Development

BS ISO 25387 ISO 25387 Microbeam analysis. Analytical electron microscopy. Procedures for determining the point resolution of high-resolution transmission electron microscope

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