| BS IEC 61832:1999 | Analyser systems. Guide to technical enquiry and bid evaluation | Current |
| BS EN 16280:2012 | Breath alcohol test devices for general public. Requirements and test methods | Current |
| BS EN 15964:2011 | Breath alcohol test devices other than single use devices. Requirements and test methods | Current |
| BS EN 12698-2:2007 | Chemical analysis of nitride bonded silicon carbide refractories - XRD methods | Current |
| BS EN 12698-1:2007 | Chemical analysis of nitride bonded silicon carbide refractories - Chemical methods | Current |
| BS ISO 78-2:1999 | Chemistry. Layout for standards - Methods of chemical analysis | Current |
| BS 5379:1976 | Determination of the sulphur content of petroleum products by the Wickbold combustion method | Withdrawn |
| BS EN 50271:2010 | Electrical apparatus for the detection and measurement of combustible gases, toxic gases or oxygen. Requirements and tests for apparatus using software and/or digital technologies | Current |
| BS EN 50104:1996 | Electrical apparatus for the detection and measurement of oxygen. Performance requirements and test methods | Withdrawn |
| BS EN 50104:1999 | Electrical apparatus for the detection and measurement of oxygen. Performance requirements and test methods | Withdrawn |
| BS 6438-3:1986 | Electrochemical analyzers - Method for specifying performance of electrolytic conductivity analyzers | Withdrawn |
| BS 6438-1:1984 | Electrochemical analyzers - Method for specifying performance common to all analyzers | Withdrawn |
| BS 6438-2:1984 | Electrochemical analyzers - Method for specifying performance of pH value analyzers | Withdrawn |
| BS ISO 16413:2013 | Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting | Current |
| BS EN 60746-1:2003 | Expression of performance of electrochemical analyzers - General | Current |
| BS EN 60746-3:2002 | Expression of performance of electrochemical analyzers - Electrolytic conductivity | Current |
| BS EN 60746-2:2003 | Expression of performance of electrochemical analyzers - pH value | Current |
| BS EN 61207-3:2002 | Expression of performance of gas analyzers - Paramagnetic oxygen analyzers | Current |
| BS EN 61207-1:2010 | Expression of performance of gas analyzers - General | Current |
| BS EN ISO 6143:2006 | Gas analysis. Comparison methods for determining and checking the composition of calibration gas mixtures | Current |
| BS EN ISO 14912:2006 | Gas analysis. Conversion of gas mixture composition data | Current |
| BS EN ISO 16664:2008 | Gas analysis. Handling of calibration gases and gas mixtures. Guidelines | Current |
| BS EN ISO 15796:2008 | Gas analysis. Investigation and treatment of analytical bias | Current |
| BS EN ISO 6145-4:2008 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Continuous syringe injection method | Current |
| BS EN ISO 6145-6:2008 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Critical orifices | Current |
| BS EN ISO 6145-8:2008 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Diffusion method | Current |
| BS EN ISO 6145-10:2008 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Permeation method | Current |
| BS EN ISO 6145-11:2008 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Electrochemical generation | Current |
| BS EN ISO 6145-5:2010 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Capillary calibration devices | Current |
| BS EN ISO 6145-7:2010 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Thermal mass-flow controllers | Current |
| BS EN ISO 6145-9:2010 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Saturation method | Current |
| BS ISO 6145-5:2001 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Capillary calibration devices | Withdrawn |
| BS ISO 6145-7:2001 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Thermal mass-flow controllers | Withdrawn |
| BS ISO 6145-9:2001 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Saturation method | Withdrawn |
| BS ISO 6145-2:2001 | Gas analysis. Preparation of calibration gas mixtures using dynamic volumetric methods - Volumetric pumps | Current |
| BS EN ISO 6142:2006 | Gas analysis. Preparation of calibration gas mixtures. Gravimetric method | Current |
| BS EN ISO 6144:2006 | Gas analysis. Preparation of calibration gas mixtures. Static volumetric method | Current |
| BS EN ISO 6141:2006 | Gas analysis. Requirements for certificates for calibration gases and gas mixtures | Current |
| BS ISO 7504:2001 | Gas analysis. Vocabulary | Current |
| DD ISO/TS 29041:2008 | Gas mixtures. Gravimetric preparation. Mastering correlations in composition | Current |
| BS 6337-1:1983 | General methods of chemical analysis - Method for determination of traces of sulphur compounds by reduction and titrimetry | Current |
| BS 6337-2:1983 | General methods of chemical analysis - Method for determination of silicon content (reduced molybdosilicate spectrophotometric method) | Current |
| BS 6337-3:1983 | General methods of chemical analysis - Method for determination of iron content (1,10-phenanthroline spectrophotometric method) | Current |
| BS 6337-4:1984 | General methods of chemical analysis - Method for determination of chloride ions by potentiometry | Current |
| BS 3282:1969 | Glossary of terms relating to gas chromatography | Current |
| BS 4603:1970 | Method for determination of residue on ignition or ash of chemical products | Current |
| BS 4404:1968 | Method for the determination of arsenic (silver diethyldithiocarbamate procedure) | Withdrawn |
| BS 4559-3:1983 | Methods for preparation of calibration gas mixtures - Static volumetric methods | Withdrawn |
| BS 4559-6:1981 | Methods for preparation of calibration gas mixtures - Saturation method | Withdrawn |
| BS 4559-7:1981 | Methods for preparation of calibration gas mixtures - Permeation method | Withdrawn |
| BS 4559-8:1985 | Methods for preparation of calibration gas mixtures - Mass dynamic method | Withdrawn |
| BS 4559-4:1988 | Methods for preparation of calibration gas mixtures - Certificate of mixture preparation | Withdrawn |
| BS 4559-9.1:1988 | Methods for preparation of calibration gas mixtures. Comparison methods and methods for establishing traceability - Determination of composition by comparison methods | Withdrawn |
| BS 4559-9.2:1988 | Methods for preparation of calibration gas mixtures. Comparison methods and methods for establishing traceability - Checking by a comparison method | Withdrawn |
| BS 4559-5.1:1987 | Methods for preparation of calibration gas mixtures. Dynamic volumetric methods - Review of methods of calibration | Withdrawn |
| BS 4559-5.3:1987 | Methods for preparation of calibration gas mixtures. Dynamic volumetric methods - Periodic injections into a flowing gas stream | Withdrawn |
| BS 4559-5.4:1987 | Methods for preparation of calibration gas mixtures. Dynamic volumetric methods - Continuous injection method | Withdrawn |
| BS 4559-5.6:1987 | Methods for preparation of calibration gas mixtures. Dynamic volumetric methods - Sonic orifices | Withdrawn |
| BS 4559-1.1:1983 | Methods for preparation of calibration gas mixtures. Weighing methods - Mixtures containing components fully vaporizable under ambient conditions | Withdrawn |
| BS 5309-1:1976 | Methods for sampling chemical products - Introduction and general principles | Obsolescent |
| BS 5309-2:1976 | Methods for sampling chemical products. - Sampling of gases | Obsolescent |
| BS 5309-3:1976 | Methods for sampling chemical products. - Sampling of liquids | Obsolescent |
| BS 5309-4:1976 | Methods for sampling chemical products. - Sampling of solids | Obsolescent |
| BS 2511:1970 | Methods for the determination of water (Karl Fischer method) | Current |
| BS 4401-11:1979 | Methods of test for meat and meat products - Determination of L(-)-hydroxyproline content (reference method) | Withdrawn |
| BS 1673-9:1973 | Methods of test for raw rubber and unvulcanized compounded rubber - Chemical analysis of butadiene rubber | Withdrawn |
| BS 4550-2:1970 | Methods of testing cement - Chemical tests | Withdrawn |
| BS EN ISO 10723:2012 | Natural gas. Performance evaluation for analytical systems | Current |
| BS EN ISO 10723:2002 | Natural gas. Performance evaluation for on-line analytical systems | Withdrawn |
| BS IEC 61831:1999 | On-line analyser systems. Guide to design and installation | Withdrawn |
| BS 5443:1977 | Recommendations for a standard layout for methods of chemical analysis by gas chromatography | Current |
| DD ISO/TS 25138:2010 | Surface chemical analysis. Analysis of metal oxide films by glow-discharge optical-emission spectrometry | Current |
| BS ISO 16962:2005 | Surface chemical analysis. Analysis of zinc- and/or aluminium-basedmetal lic coatings by glow-discharge optical-emission spectrometry | Withdrawn |
| BS ISO 18516:2006 | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution | Current |
| PD ISO/TR 19319:2003 | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser | Withdrawn |
| BS ISO 18118:2004 | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials | Current |
| BS ISO 20903:2006 | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results | Withdrawn |
| BS ISO 20903:2011 | Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results | Current |
| PD ISO/TR 18394:2006 | Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information | Current |
| BS ISO 15471:2004 | Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters | Current |
| BS ISO 24236:2005 | Surface chemical analysis. Auger electron spectroscopy. Repeatability and constancy of intensity scale | Current |
| BS ISO 29081:2010 | Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction | Current |
| PD ISO/TR 14187:2011 | Surface chemical analysis. Characterization of nanostructured materials | Current |
| BS ISO 17331:2004+A1:2010 | Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy | Current |
| BS ISO 28600:2011 | Surface chemical analysis. Data transfer format for scanning-probe microscopy | Current |
| DD ISO/TR 15969:2001 | Surface chemical analysis. Depth profiling. Measurement of sputtered depth | Current |
| PD ISO/TR 22335:2007 | Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer | Current |
| BS ISO 16531:2013 | Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS | Current |
| BS ISO 14706:2000 | Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy | Current |
| PD ISO/TR 19319:2013 | Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods | Current |
| BS ISO 11505:2012 | Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry | Current |
| DD ISO/TS 15338:2009 | Surface chemical analysis. Glow discharge Mass spectrometry (GD-MS). Introduction to use | Current |
| BS ISO 18116:2005 | Surface chemical analysis. Guidelines for preparation and mounting of specimens for analysis | Current |
| BS ISO 18117:2009 | Surface chemical analysis. Handling of specimens prior to analysis | Current |
| BS ISO 17974:2002 | Surface chemical analysis. High-resolution Auger electron spectrometers. Calibration of energy scales for elemental and chemical-state analysis | Current |
| BS ISO 22048:2004 | Surface chemical analysis. Information format for static secondary-ion mass spectrometry | Current |
| BS ISO 14975:2000 | Surface chemical analysis. Information formats | Current |
| BS ISO 17973:2002 | Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis | Current |
| PD ISO/TR 16268:2009 | Surface chemical analysis. Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation | Current |
| BS ISO 16242:2011 | Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES) | Current |
| BS ISO 16243:2011 | Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS) | Current |
| BS ISO 27911:2011 | Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope | Current |
| BS ISO 11039:2012 | Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate | Current |
| BS ISO 13084:2011 | Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer | Current |
| BS ISO 14237:2010 | Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials | Current |
| BS ISO 14237:2000 | Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials | Withdrawn |
| BS ISO 18114:2003 | Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials | Current |
| BS ISO 23812:2009 | Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials | Current |
| BS ISO 12406:2010 | Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon | Current |
| BS ISO 17560:2002 | Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon | Current |
| BS ISO 20341:2003 | Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials | Current |
| BS ISO 23830:2008 | Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry | Current |
| BS ISO 14606:2000 | Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials | Current |
| BS ISO 18115:2001+A2:2007 | Surface chemical analysis. Vocabulary | Withdrawn |
| BS ISO 18115-1:2010 | Surface chemical analysis. Vocabulary - General terms and terms used in spectroscopy | Current, Work in Hand |
| BS ISO 18115-2:2010 | Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy | Current, Work in Hand |
| BS ISO 21270:2004 | Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale | Current |
| BS ISO 15472:2001 | Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales | Withdrawn |
| BS ISO 15472:2010 | Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales | Current |
| BS ISO 15470:2004 | Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters | Current |
| BS ISO 10810:2010 | Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis | Current |
| BS ISO 14701:2011 | Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness | Current |
| BS ISO 16129:2012 | Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer | Current |
| BS ISO 24237:2005 | Surface chemical analysis. X-ray photoelectron spectroscopy. Repeatability and constancy of intensity scale | Current |
| BS ISO 19318:2004 | Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction | Current |