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Optical instruments

Standards in development (97)

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Standard TitleStatus
BS EN 12464-2 Light and lighting - Lighting of work places Part 2: Outdoor work placesAccepted
BS EN 13032-4 Light and lighting - Measurement and presentation of photometric data of lamps and luminaires Part 4: LED light sources and luminairesAccepted
BS EN 16237/COR_2013 + C1 sources of incoherent optical radiationPublication
BS EN 60534-8-4 Ed 3.0 Industrial-process control valves Part 8-4: Noise considerations - Prediction of noise generated by hydrodynamic flowPublic Comment
BS EN 60770-3 Ed 2.0 Review report on IEC 60770-3 Ed 1: Transmitters for use in industrial-process control systems Part 3: Methods for performance evaluation of intelligent transmittersPublic Comment
BS EN 60793-2-40 Ed 4.0 Optical fibres Part 40: Product specifications - Sectional specification for category A4 multimode fibresAccepted
BS EN 61115, ED.2 Expression of performance of sample handling systems for process analyzersPublic Comment
BS EN 61158-6-x Ed 3.0 Industrial communication networks - Fieldbus specifications Part 6-x: Application layer protocol specification Type x elementsPublic Comment
BS EN 61207-6 Ed 2.0 Expression of Performance of Gas Analyzers- Part 6: Photometric analyzersPublic Comment
BS EN 61285 Ed 3.0 Industrial Process Control - Safety of Analyzer HousesAccepted
BS EN 61300-2-43 Ed 2.0 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures Part 2-43: Tests - Screen testing of return loss of single mode PC optical fibre connectorsAccepted
BS EN 61499-4 Ed 2.0 Function blocks Part 4: Rules for compliance profilesApproval
BS EN 61755-1 Ed 2.0 Fibre optic interconnecting devices and passive components -Fibre optic connector optical interfaces Part 1: Optical interfaces for single mode non-dispersion shifted fibres - General and guidanceAccepted
BS EN 61755-2-1 Ed 2.0 Fibre optic interconnecting devices and passive components -Fibre optic connector optical interfaces Part 2-1: Connection of non-dispersion shifted single mode non-angled physically contacting fibresAccepted
BS EN 61755-2-2 Ed 2.0 Fibre optic interconnecting devices and passive components -Fibre optic connector optical interfaces Part 2-2: Connection of non-dispersion shifted single mode angled physically contacting fibresAccepted
BS EN 61755-3-1 Ed 2.0 Fibre optic interconnecting devices and passive components -Fibre optic connector optical interfaces Part 3-1: Connectors with 2;5 mm and 1;25 mm diameter cylindrical full zirconia ferrule; non-angled single mode non-dispersion shifted fibresAccepted
BS EN 61755-3-2 Ed 2.0 Fibre optic interconnecting devices and passive components -Fibre optic connector optical interfaces Part 3-2: Connectors with 2;5 mm and 1;25 mm diameter cylindrical full zirconia ferrule; angled single mode non-dispersion shifted fibresAccepted
BS EN 61784-5-19 Industrial communication networks - Profiles Part 5-n Installation of fieldbuses - Installation profiles for MECHATROLINKPublic Comment
BS EN 62129-1 Calibration of wavelength/optical frequency measurement instruments Part 1: Optical spectrum analyzersAccepted
BS EN 62424 Ed 1.0 /A1 Representation of process control engineering - Request in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools.Accepted
BS EN 62443-1-3 Industrial communication networks - Network and system security Part 1-3: System security compliance metricsAccepted
BS EN 62443-2-4 Security for industrial process measurement and control - Network and system security Part 2-4: Certification of IACS supplier security policies and practicesAccepted
BS EN 62443-3-2 Industrial communication networks - Network and system security Part 3-2: Security assurance levels for zones and conduitsAccepted
BS EN 62443-3-3 Industrial communication networks - Network and system security Part 3-3: System security requirements and security assurance levelApproval
BS EN 62496-2-4 Optical circuit boards Part 2-4: Tests - Optical transmission test for optical circuit boards without input/output fibresApproval
BS EN 62522 ED 1.0 Calibration of tuneable laser sourcesPublic Comment
BS EN 62708 Documents for electrical and instrumentation projects in the process industryAccepted
BS EN ISO 11252 Lasers and laser-related equipment - Laser device - Minimum requirements for documentationApproval
BS EN WI 00169065 Daylight in BuildingsIdea
BS ENISO 11151-1 Lasers and laser-related equipment - Standard optical components Part 1: Components for the UV, visible and near-infrared spectral rangesPublic Comment
BS ENISO 11151-2 Lasers and laser-related equipment - Standard optical components Part 2: Components for the infrared spectral rangePublic Comment
BS ISO 10109 Optics and photonics - Guidance for the selection of environmental testsPublic Comment
BS ISO 10110-12:2007/AMD 1 Optics and photonics - Preparation of drawings for optical elements and systems Part 12: Aspheric surfacesApproval
BS ISO 10110-19 Optics and photonics - Preparation of drawings for optical elements and systems Part 18: Freeform surfacesPublic Comment
BS ISO 10110-5 Optics and photonics - Preparation of drawings for optical elements and systems Part 5: Surface form tolerancesPublic Comment
BS ISO 10110-6 Optics and optical instruments - Preparation of drawings for optical elements and systems Part 6: Centring tolerancesPublic Comment
BS ISO 11775 Surface chemical analysis - Scanning probe microscopy - Determination of cantilever normal spring constantsPublic Comment
BS ISO 11952 Surface chemical analysis - Scanning probe microscopy - Determination of geometric quantities using SPM - Calibration of measuring systemsApproval
BS ISO 12154 Determination of density by volumetric displacement - Skeleton density by gas pycnometryPublic Comment
BS ISO 12858-2:1999/AMD 1 Optics and optical instruments - Ancillary devices for geodetic instruments Part 2: TripodsPublic Comment
BS ISO 13083 Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposesPublic Comment
BS ISO 13095 Surface chemical analysis - Procedure for in situ characterization of AFM probes used for nanostructure measurementAccepted
BS ISO 13099-3 Methods for zeta potential determination Part 3: Acoustic methodsPublic Comment
BS ISO 13142 Electro-optical systems - Cavity ring-down technique for high-reflectance measurementAccepted
BS ISO 13317-4 Determination of particle size distribution by gravitational liquid sedimentation methods Part 4: Balance methodPublic Comment
BS ISO 13322-1 Particle size analysis - Image analysis methods Part 1: Static image analysis methodsPublic Comment
BS ISO 13424 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of results for thin film analysisApproval
BS ISO 14132-3 Optics and optical instruments - Vocabulary for telescopic systems Part 3: Terms for telescopic sightsAccepted
BS ISO 14135-1 Optics and optical instruments - Specifications for telescopic sights Part 1: General-purpose instrumentsAccepted
BS ISO 14135-2 Optics and optical instruments - Specifications for telescopic sights Part 2: High-performance instrumentsAccepted
BS ISO 14490-3 Optics and optical instruments - Test methods for telescopic systems Part 3: Test methods for telescopic sightsAccepted
BS ISO 14490-5 Optics and optical instruments - Test methods for telescopic systems Part 5: Test methods for transmittanceAccepted
BS ISO 14606 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materialsPublic Comment
BS ISO 14706 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopyAccepted
BS ISO 14707 Surface chemical analysis - Glow discharge optical emission spectrometry (GD-OES) - Introduction to useAccepted
BS ISO 14999-4 Optics and photonics - Interferometric measurement of optical elements and optical systems Part 4: Interpretation and evaluation of tolerances specified in ISO 10110Public Comment
BS ISO 15901-1 Pore size distribution and porosity of solid materials by mercury porosimetry and gas adsorption Part 1: Mercury porosimetryAccepted
BS ISO 16531 Surface Chemical Analysis - Depth Profiling - Guideline of ion beam alignment for depth profiling in Auger electron spectroscopy and X-ray photoelectron spectroscopyApproval
BS ISO 17109 Surface chemical analysis - Depth profiling - A method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using multi-layer thin filmsAccepted
BS ISO 17328 Optics and photonics - Optical materials and components - Test method for refractive index of infrared optical materialsPublic Comment
BS ISO 17411 Optics and photonics - Optical materials and components - Test method for homogeneity of optical glasses by laser interferometryPublic Comment
BS ISO 17862 Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysersPublic Comment
BS ISO 17901-1 Optics and photonics - Holography Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of hologramsAccepted
BS ISO 17901-2 Optics and photonics - Holography Part 2: Methods for measurement of hologram recording characteristicsAccepted
BS ISO 17980 Surface chemical analysis - Surface characterization methods to measure surface properties of biomaterials and corresponding biointeractionsAccepted
BS ISO 18115-1 Surface chemical analysis - Vocabulary Part 1: General terms and terms used in spectroscopyApproval
BS ISO 18115-2 Surface chemical analysis - Vocabulary Part 2: Terms used in scanning-probe microscopyApproval
BS ISO 18337 Surface chemical analysis - Measurement of lateral resolution of confocal fluorescence microscopeAccepted
BS ISO 18340 Endotherapy devices - Eyepiece funnel and light guide connectorAccepted
BS ISO 18554 Procedures for identifying, estimating and correcting for unintended degradation in a material undergoing analysis by X-ray photoelectron spectroscopyIdea
BS ISO 19012-1 Microscopes - Designation of microscope objectives Part 1: Flatness of field/PlanApproval
BS ISO 19012-3 Microscopes - Designation of microscope objectives Part 3: Spectral transmittanceAccepted
BS ISO 20998-2 Measurement and characterization of particles by acoustic methods Part 2: Guidelines for linear theoryApproval
BS ISO 26824 Particle characterization of particulate systems - VocabularyApproval
BS ISO 27891 Aerosol particle number concentration - Calibration of condensation particle number countersAccepted
BS ISO 3310-2 Test sieves - Technical requirements and testing Part 2: Test sieves of perforated metal plateApproval
BS ISO 8037-2 Optics and optical instruments - Microscopes - Slides Part 2: Quality of material, standards of finish and mode of packagingPublic Comment
BS ISO 8038 Microscopes - Screw threads for objectives and related nosepiecesPublic Comment
BS ISO 8255-2 Optics and optical instruments - Microscopes - Cover glasses Part 2: Quality of materials, standards of finish and mode of packagingApproval
BS ISO 8600-2 Optics and optical instruments - Medical endoscopes and endoscopic accessories Part 2: Particular requirements for rigid bronchoscopesPublic Comment
BS ISO 8600-4 Optics and optical instruments - Medical endoscopes and certain accessories Part 4: Determination of maximum width of insertion portionPublic Comment
BS ISO 9022-23 Optics and photonics - Environmental test methods Part 23: Low pressure combined with cold, ambient temperature and dry and damp heatPublic Comment
BS ISO 9276-2 Representation of results of particle size analysis Part 2: Calculation of average particle sizes/diameters and moments from particle size distributionsPublic Comment
BS ISO 9849 Optics and optical instruments - Geodetic and surveying instruments - VocabularyPublic Comment
BSEN62239-1 ED 1.0 Modular Cmponent Interfaces for Surface-Mount Fluid distribution Components Part 1: Elastomeric SealsPublic Comment
BSEN62269 ED.1.0 TR ED.1 Chemometrics for Process Instrumentation,,Public Comment
PD IEC/TR 62443-3-1:2009 EDITI Industrial communication networks Network and system security Part 3-1: Security technologies for industrial automation and control sy stemsnull
PD IEC/TR 62658 ED 1.0 Standardisation roadmap of optical circuit boards and their related packaging technologiesApproval
PD IEC/TR 62794 ED 1.0 Industrial-process measurement; control and automation - Reference model for representation of production facilities (Digital Factory)Approval
PD IEC/TS 62443-1-1:2009 EDITION 1 Industrial communication networks Network and system security Part 1-1: Terminology, concepts and modelsnull
PD IEC/TS 62492-2 Ed 1.0 Industrial process control devices - Radiation thermometers - Part 2: Determination of the technical data for radiation thermometersApproval
PD IEC/TS 62661-2-1 ED 1.0 Optical backplanes - Product specifications Part 2-1: Optical backplane using optical fibre circuit boards and multi -core right angle optical connectorsApproval
PD ISO/TR 13097 Guidelines for the characterization of dispersion stabilityApproval
PD ISO/TR/TR 13096 Surface chemical analysis - Scanned probe microscopy - Guide to describe AFM probe propertiesAccepted
PD ISO/TS 17915 Optics and photonics - Measuring method of semiconductor lasers for sensingApproval
PD ISO/TS 18339 Endotherapy devices - Trocar pins, trocar sleeves and endotherapy devices for use with trocar sleevesAccepted
PD ISO/TS 18507 Technical Specification for the use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysisAccepted

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